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Research Interests

Papers共 84 篇Author StatisticsCo-AuthorSimilar Experts

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Experimental Segmentation of Vertical Charge Loss Mechanisms in Charge Trap-Based 3D NAND Arrays
L. Chiavarone,G. Nicosia,N. Righetti,Y. Dong
2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024 (2024)
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3D NAND Scaling in the next decade
Russ Meyer,Yoshiaki Fukuzumi,Yingda Dong
2022 INTERNATIONAL ELECTRON DEVICES MEETING, IEDMpp.26.1.1-26.1.4, (2022)
Cited6Views0EIWOSBibtex
6
0
A 512Gb 3b/Cell Flash Memory on 64-Word-Line-Layer BiCS Technology
竜二 山下,Sagar Magia, 勉 樋口, 和英 米谷, 俊雄 山村, 裕之 水越, 真吾 財津, 実 山下, 俊一 外山, 典裕 釜江,Juan Lee,Shuo Chen,Jiawei Tao,William Mak,Xiaohua Zhang,Ying Yu,裕子 宇都宮,洋介 加藤, 雅秀 松本,Hardwell Chibvongodze, 直樹 大熊, 紘貴 矢部,Subodh Taigor,Rangarao Samineni, 択洋 児玉, 義彦 鎌田, 譲 生居,Jonathan Huynh,Sung-En Wang,Yankang He,Trung Pham,Vivek Saraf,Akshay Petkar, 光恭 渡邉, 浩一郎 林,Prashant Swarnkar, 仁 三輪,Aditya Pradhan,Sulagna Dey,Debasish Dwibedy,Thushara Xavier,Muralikrishna Balaga,Samiksha Agarwal,Swaroop Kulkarni,Zameer Papasaheb,Sahil Deora,Patrick Hong,Meiling Wei,Gopinath Balakrishnan, 卓弥 有木,Kapil Verma,Chang Siau,Yingda Dong,Ching-Huang Lu,達 三輪,Farookh Moogat
IEICE technical report. Speechno. 9 (2017): 45-50
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Author Statistics

#Papers: 84

#Citation: 2221

H-Index: 26

G-Index: 37

Sociability: 5

Diversity: 1

Activity: 0

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