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论文共 110 篇作者统计合作学者相似作者

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Manufacturing Yield Improvement for Advanced CMOS Technology Middle-of-Line Interconnect with Cobalt Metallization : YE: YieldEnhancement/Learning
S.-C. Fan,P. Jamison,S. Pancharatnam,M. Sankarapandian,R. Xie,C. Waskiewicz,J. Strane, J. Lee,H. Shobha,J. Demarest, C. Peethala,H. Jagannathan, J. Wynne
2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)pp.1-3, (2023)
引用0浏览0EIWOS引用
0
0
Vertical-Transport Nanosheet Technology for CMOS Scaling Beyond Lateral-Transport Devices
H. Jagannathan,B. Anderson,C-W Sohn,G. Tsutsui,J. Strane,R. Xie,S. Fan,K- Kim,S. Song,S. Sieg,I Seshadri,S. Mochizuki,J. Wang,A. Rahman, K-Y Cheon,I Hwang,J. Demarest,J. Do, J. Fullam, G. Jo, B. Hong,Y. Jung, M. Kim, S. Kim, R. Lallement,T. Levin, J. Li,E. Miller, P. Montanini,R. Pujari, C. Osborn,M. Sankarapandian,G-H Son,C. Waskiewicz,H. Wu,J. Yim, A. Young,C. Zhang, A. Varghese,R. Robison,S. Burns, K. Zhao, T. Yamashita,D. Dechene,D. Guo,R. Divakaruni,T. Wu,K- Seo,H. Bu
2021 IEEE International Electron Devices Meeting (IEDM) (2021)
引用12浏览0EIWOS引用
12
0
Low Angle Annular Dark Field Scanning Transmission Electron Microscopy Analysis of Phase Change Material
J. Li,K. Brew, K. Cheng,V. Chan,N. Arnold,A. Gasasira,R. Pujari,J. Demarest, M. Iwatake,L. Tierney, O. Ogundipe, K. Toole, N. Li
International Symposium for Testing and Failure AnalysisISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis (2021)
引用1浏览0引用
1
0
Failure Analysis Challenges of Phase Change Memory Test Structures with Two Case Studies
J. Demarest,N. Arnold,K. Brew,V. Chan, A. Cote,T. Gordon, M. Iwatake,G. Lian, J. Li,I. OK,S. McDermott,I. Saraf,N. Saulnier,L. Tierney, A. Varghese
International Symposium for Testing and Failure AnalysisISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis (2021)
引用0浏览0引用
0
0
Selective deposition of AlOx for Fully Aligned Via in nano Cu interconnects
Son Van Nguyen,H. Shobha,C. B. Peethala,T. Haigh,H. Huang, J. Li,J. Demarest,B. Haran,Dennis Hausmann, P. Lemaire,K. Sharma, P. Ramani, A. Mahorowala
2021 IEEE International Interconnect Technology Conference (IITC)pp.1-2, (2021)
引用2浏览0EIWOS引用
2
0
Impact of Nanosecond Laser Anneal on PVD Ru Films
D. Sil,Y. Sulehria,O. Gluschenkov,T. Nogami, R. Cornell,A. Simon, J. Li,J. Demarest,B. Haran,C. Lavoie,J. Jordan-Sweet,V Stanic, J. Liu,K. Huet,F. Mazzamuto
2021 IEEE International Interconnect Technology Conference (IITC)pp.1-3, (2021)
引用4浏览0EIWOS引用
4
0
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作者统计

#Papers: 108

#Citation: 1598

H-Index: 24

G-Index: 36

Sociability: 7

Diversity: 2

Activity: 1

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