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个人简介
Timothy M. Philip (Member, IEEE) received the B.S. and M.S. degrees in electrical engineering from the Georgia Institute of Technology in 2012 and 2014, respectively, and the Ph.D degree in electrical engineering from the University of Illinois at Urbana-Champaign in 2018.
Since 2018, he has been a Research Staff Member with IBM Research in Albany, NY, USA, where he uses TCAD and atomistic modeling to characterize the performance of emerging neuromorphic computing devices.
研究兴趣
论文共 33 篇作者统计合作学者相似作者
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Manuel Le Gallo,Riduan Khaddam-Aljameh,Milos Stanisavljevic,Athanasios Vasilopoulos,Benedikt Kersting,Martino Dazzi,Geethan Karunaratne,Matthias Brändli,Abhairaj Singh,Silvia M. Müller,Julian Büchel,Xavier Timoneda,Vinay Joshi,Malte J. Rasch,Urs Egger,Angelo Garofalo,Anastasios Petropoulos,Theodore Antonakopoulos,Kevin Brew,Samuel Choi,Injo Ok,Timothy Philip,Victor Chan, Claire Silvestre,Ishtiaq Ahsan,Nicole Saulnier,Vijay Narayanan,Pier Andrea Francese,Evangelos Eleftheriou,Abu Sebastian
Nature Electronicsno. 9 (2023): 680-693
IEEE Transactions on Semiconductor Manufacturingno. 3 (2023): 327-331
2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)pp.1-4, (2023)
G. S. Syed,K. Brew,A. Vasilopoulos,V. P. Jonnalagadda,B. Kersting,T. Philip,V. Bragaglia,S. Ambrogio,J. Büchel, J. Giannopoulos,M. Le Gallo,C.-W. Cheng,M. BrightSky,V. Narayanan,N. Saulnier,A. Sebastian
IEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMSno. 4 (2023): 1052-1061
S. Ambrogio,P. Narayanan,A. Okazaki, A. Fasoli,C. Mackin,K. Hosokawa,A. Nomura, T. Yasuda,A. Chen,A. Friz,M. Ishii, J. Luquin,Y. Kohda,N. Saulnier,K. Brew,S. Choi,I. Ok,T. Philip,V. Chan,C. Silvestre,I. Ahsan,V. Narayanan,H. Tsai,G. W. Burr
NATUREno. 7975 (2023): 768-775
Martin M. Frank,Ning Li,Malte J. Rasch,Shubham Jain,Ching-Tzu Chen,Ramachandran Muralidhar,Jin-Ping Han,Vijay Narayanan,Timothy M. Philip,Kevin Brew,Andrew Simon,Iqbal Saraf,Nicole Saulnier,Irem Boybat,StanisŁaw Woźniak,Abu Sebastian,Pritish Narayanan,Charles Mackin,An Chen,Hsinyu Tsai,Geoffrey W. Burr
2023 IEEE International Reliability Physics Symposium (IRPS)pp.1-10, (2023)
IEEE TRANSACTIONS ON ELECTRON DEVICESno. 12 (2023): 6279-6285
2022 INTERNATIONAL ELECTRON DEVICES MEETING, IEDM (2022)
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作者统计
#Papers: 33
#Citation: 261
H-Index: 10
G-Index: 15
Sociability: 5
Diversity: 0
Activity: 1
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