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Binod Kumar (S’16) received the B.Tech. degree from the National Institute of Technology, Silchar, Silchar, India, in 2013. He is a currently pursuing the Ph.D. degree with the Department of Electrical Engineering, Indian Institute of Technology Bombay, Mumbai, India, where he had enrolled in 2014 for the master’s program.
He has published several papers on post-silicon validation and very large-scale integration testing in the IEEE international conferences and workshops. His current research interests include design verification, and test and processor validation with a focus on memory consistency issues.
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Anshul Jain,Binod Kumar
2023 IEEE 32nd Asian Test Symposium (ATS)pp.165-170, (2023)
ICECS 2022pp.1-4, (2022)
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