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职业迁徙
个人简介
He leads a team working on strained-channel transistors, high-mobility transistors, contact resistance reduction technologies, and devices with steep subthreshold swing. He has authored or co-authored 370 journal and conference papers, and a book chapter. He has 88 U.S. Patents.
He received the 1995 IEE Prize from the Institution of Electrical Engineers, U.K, the 1996 Lee Kuan Yew Gold Medal, the 1996 Institution of Engineers Singapore Gold Medal, 1997-2001 NUS Overseas Graduate Scholarship Award, the 2001 IEEE Electron Devices Society Graduate Student Fellowship Award, the 2002 IEEE Paul Rappaport Award, 2003 TSMC Invention Awards, 2006 Singapore Young Scientist Award, and 2006 Singapore Youth Award in Science and Technology. He also received a 2008 National Research Foundation Fellowship, a 2008 NUS Young Researcher Award, and the 2008 IEEE Paul Rappaport Award.
He received the 1995 IEE Prize from the Institution of Electrical Engineers, U.K, the 1996 Lee Kuan Yew Gold Medal, the 1996 Institution of Engineers Singapore Gold Medal, 1997-2001 NUS Overseas Graduate Scholarship Award, the 2001 IEEE Electron Devices Society Graduate Student Fellowship Award, the 2002 IEEE Paul Rappaport Award, 2003 TSMC Invention Awards, 2006 Singapore Young Scientist Award, and 2006 Singapore Youth Award in Science and Technology. He also received a 2008 National Research Foundation Fellowship, a 2008 NUS Young Researcher Award, and the 2008 IEEE Paul Rappaport Award.
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Navab Singh, Umesh Chand, Shiv Kumar, Xuan Sang Xuan Nguyen, Lakshmi Kanta Bera,Surasit Chung,Xiao Gong,Yee Chia Yeo
ECS Meeting Abstractsno. 32 (2024): 2295-2295
Shien-Yang Wu,C. H. Chang,M. C. Chiang,C. Y. Lin,J. J. Liaw,J. Y. Cheng,J. Y. Yeh,H. F. Chen,S. Y. Chang, K. T. Lai,M. S. Liang,K. H. Pan,J. H. Chen,V. S. Chang, T. C. Luo,X. Wang, Y. S. Mor,C. I. Lin,S. H. Wang, M. Y. Hsieh,C. Y. Chen,B. F. Wu,C. J. Lin,C. S. Liang,C. P. Tsao, C. T. Li,C. H. Chen,C. H. Hsieh,H. H. Liu,P. N. Chen,C. C. Chen,R. Chen,Y. C. Yeo,C. O. Chui,W. Chang,T. L. Lee,K. B. Huang,H. J. Lin,K. W. Chen,M. H. Tsai,K. S. Chen, X. M. Chen,Y. K. Cheng,C. H. Wang, W. Shue,Y. Ku,S. M. Jang,M. Cao,L. C. Lu,T. S. Chang
Chih-Hao Chang,V. S. Chang,K. H. Pan, K. T. Lai, J. H. Lu, J. A. Ng,C. Y. Chen,B. F. Wu, C. J. Lin, C. S. Liang,C. P. Tsao, Y. S. Mor, C. T. Li,T. C. Lin,C. H. Hsieh,P. N. Chen, H. H. Hsu,J. H. Chen,H. F. Chen,J. Y. Yeh,M. C. Chiang,C. Y. Lin,J. J. Liaw,C. H. Wang, S. B. Lee,C. C. Chen,H. J. Lin,R. Chen, K. W. Chen,C. O. Chui,Y. C. Yeo,K. B. Huang,T. L. Lee,M. H. Tsai,K. S. Chen, Y. C. Lu,S. M. Jang, S. -Y. Wu
2022 International Electron Devices Meeting (IEDM) (2022)
Geoffrey Yeap,S. S. Lin, Y. M. Chen, H. L. Shang,P. W. Wang,H. C. Lin,Y. C. Peng,J. Y. Sheu,M. Wang,X. Chen,B. R. Yang,C. P. Lin, F. C. Yang,Y. K. Leung,D. W. Lin, C. P. Chen,K. F. Yu,D. H. Chen, C. Y. Chang,H. K. Chen, P. Hung,C. S. Hou,Y. K. Cheng,J. Chang, L. Yuan,C. K. Lin,C. C. Chen,Y. C. Yeo,M. H. Tsai, H. T. Lin,C. O. Chui,K. B. Huang,W. Chang,H. J. Lin,K. W. Chen,R. Chen,S. H. Sun, Q. Fu, H. T. Yang,H. T. Chiang,C. C. Yeh,T. L. Lee,C. H. Wang,S. L. Shue,C. W. Wu,R. Lu,W. R. Lin,J. Wu, F. Lai, Y. H. Wu, B. Z. Tien,Y. C. Huang,L. C. Lu,Jun He,Y. Ku,J. Lin,M. Cao, T. S. Chang,S. M. Jang
2019 IEEE International Electron Devices Meeting (IEDM) (2019)
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作者统计
#Papers: 799
#Citation: 23593
H-Index: 72
G-Index: 118
Sociability: 7
Diversity: 3
Activity: 0
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