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Papers共 779 篇Author StatisticsCo-AuthorSimilar Experts

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RA-Aware Fail Data Collection Architecture for Cost Reduction
Hayoung Lee,Sooryeong Lee,Sungho Kang
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMSno. 6 (2024): 1136-1149
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A Built-In Self-Repair with Maximum Fault Collection and Fast Analysis Method for HBM
Joonsik Yoon,Hayoung Lee, Youngki Moon, Seung Ho Shin,Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systemsno. 99 (2024): 1-1
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A New Pipelined Output Data Reducer of BOST for Improved Parallelism
Sooryeong Lee,Hayoung Lee, Juyong Lee,Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systemsno. 99 (2024): 1-1
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A Novel Prediction-Based Two-Tiered ECC for Mitigating SWD Errors in HBM
Youngki Moon, Seung Ho Shin, Seokjun Jang, Duyeon Won,Sungho Kang
IEEE Transactions on Very Large Scale Integration (VLSI) Systemsno. 99 (2024): 1-11
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An Area-Efficient Systolic Array Redundancy Architecture for Reliable AI Accelerator
Hayoung Lee, Jongho Park,Sungho Kang
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMSno. 10 (2024): 1950-1954
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An Efficient Low Power BIST for Automotive SoC with Periodic Pattern Type Selection
Jongho Park,Sangjun Lee, Hyemin Kim, Jaeyoung Joung, Jaehyun Kim,Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systemsno. 99 (2024): 1-1
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A Cost-Effective Per-Pin ALPG for High-Speed Memory Testing
Juyong Lee,Hayoung Lee, Sooryeong Lee,Sungho Kang
IEEE Transactions on Very Large Scale Integration (VLSI) Systemsno. 99 (2024): 1-5
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PETRA: Powerful Early Termination Based Redundancy Analysis
Youngkwang Lee,Hyojoon Yun,Younwoo Yoo,Sungho Kang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systemsno. 99 (2024): 1-1
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Author Statistics

#Papers: 781

#Citation: 9678

H-Index: 36

G-Index: 56

Sociability: 7

Diversity: 3

Activity: 72

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