基本信息
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职业迁徙
个人简介
Hayoung Lee (Graduate Student Member, IEEE) received the B.S. degree in electrical and electronic engineering from Yonsei University, Seoul, South Korea, in 2016, where he is currently pursuing the combined Ph.D. degree with the Department of Electrical and Electronic Engineering.
His current research interests include high-speed memory test, built-in self-testing, built-in self-repair, redundancy analysis algorithms, reliability, error detection/correction, system-level test and validation, design for testability/debug, and VLSI design.
研究兴趣
论文共 56 篇作者统计合作学者相似作者
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IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMSno. 6 (2024): 1136-1149
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systemsno. 99 (2024): 1-1
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systemsno. 99 (2024): 1-1
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMSno. 10 (2024): 1950-1954
IEEE Transactions on Very Large Scale Integration (VLSI) Systemsno. 99 (2024): 1-5
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systemsno. 99 (2024): 1-1
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFSno. 7 (2024): 3358-3362
IEEE Transactions on Very Large Scale Integration (VLSI) Systemspp.1-13, (2024)
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMSno. 4 (2024): 1260-1273
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作者统计
#Papers: 54
#Citation: 249
H-Index: 10
G-Index: 15
Sociability: 5
Diversity: 0
Activity: 1
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