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论文共 23 篇作者统计合作学者相似作者
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Jigang Ma, Miao Yu,Cees Lambregts, Sotirios Tsiachris,Paul Bocker,Jun-Yeob Kim,Won-Kwang Ma,Sang-Jun Han,Chan-Ha Park, Kyong-Seok Kim,Jung-Hwan Kim, Sang-Jun Park,Gwang-Gon Kim
OPTICAL MICROLITHOGRAPHY XXXIII (2021)
Amine Lakcher, Ahmed Zayed, Jennifer Shumway, Jan-Pieter Van Delft, Gratiela Isai, Ruxandra Mustata, Arno van den Brink, Taeddy Kim, Jay Jung, Yong-Sik Shin, Soo-Kyung Lee,Paul Bocker,Mohamed El Kodadi,Geert Vinken,ChanHa Park,Sangjun Han,Jeongsu Park, Beomki Shin, Gunwoong Lee
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXXIV (2020)
Honggoo Lee,Sangjun Han,Minhyung Hong,Jieun Lee,Dongyoung Lee,Ahlin Choi,Chanha Park,Dohwa Lee,Seongjae Lee,Jungtae Lee,Jeongpyo Lee,DongSub Choi,Sanghuck Jeon,Zephyr Liu,Hao Mei,Tal Marciano,Eitan Hajaj, Lilach Saltoun,Dana Klein,Eran Amit,Anna Golotsvan,Wayne Zhou, Eitan Herzl,Roie Volkovich,John C. Robinson
Metrology, Inspection, and Process Control for Microlithography XXXIII (2019)
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXXIII (2019)
Honggoo Lee,Sangjun Han,Minhyung Hong,Seungyoung Kim,Jieun Lee,Dongyoung Lee,Eungryong Oh,Ahlin Choi,DongSub Choi,Sanghuck Jeon,DoHwa Lee,Jeongpyo Lee,Jungtae Lee,Seongjae Lee,Zephyr Liu, Einat Peled,Eran Amit,Yuval Lamhot, Alexander Svizher,Dana Klein,Anat Marchelli,Roie Volkovich,Tal Yaziv, Aaron Cheng,John C. Robinson
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXXII (2018)
Honggoo Lee,Sangjun Han,Minhyung Hong,Seungyong Kim,Jieun Lee,DongYoung Lee,Eungryong Oh,Ahlin Choi, Hyowon Park, Waley Liang,DongSub Choi, Nakyoon Kim,Jeongpyo Lee,Stilian Pandev,Sanghuck Jeon,John C. Robinson
Honggoo Lee,Sangjun Han,Jaeson Woo, Junbeom Park, Changrock Son,Fatima Anis,Pradeep Vukkadala,Sanghuck Jeon,DongSub Choi,Kevin Huang,Hoyoung Heo,Mark D. Smith,John C. Robinson
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作者统计
#Papers: 23
#Citation: 64
H-Index: 4
G-Index: 6
Sociability: 5
Diversity: 1
Activity: 0
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