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Research Interests

Papers共 19 篇Author StatisticsCo-AuthorSimilar Experts

By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
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Reliability Modeling of Middle-Of-Line Interconnect Dielectrics in Advanced Process Nodes
R. Kasim,C. Lin,C. Perini, J. Palmer, N. Gilda, S. Imam, J. R. Weber, C. Wallace,J. Hicks
2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS (2023)
Cited0Views0EIWOSBibtex
0
0
A Novel Approach for Assessing Impact of Temperature Hot-Spots on Chip-Package Interaction Reliability
R. Aggarwal, L. Jiang,S. Patra, N. Lajo, E. Kabir,R. Kasim
2022 IEEE International Reliability Physics Symposium (IRPS) (2022)
Cited1Views0EIWOSBibtex
1
0
Intrinsic Reliability Study in Low-k Dielectrics with Co Metallurgy in 10nm Process
G. W. Zhang, J. Palmer,R. Kasim, C-Y Lin,C. Perini, J. R. Weber,D. Kencke,A. Madhavan
2020 IEEE INTERNATIONAL INTERCONNECT TECHNOLOGY CONFERENCE (IITC)pp.124-126, (2020)
Cited1Views0EIWOSBibtex
1
0
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Author Statistics

#Papers: 19

#Citation: 138

H-Index: 4

G-Index: 11

Sociability: 5

Diversity: 2

Activity: 1

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