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个人简介
Ndubuisi G. Orji is a senior program advisor at the National Institute of Standards and Technology, Gaithersburg, MD 20899 USA. His research interests include semiconductor device applications of nanoscale dimensional and optical metrology, surface metrology, hybrid metrology, and correlative microscopy. Orji received a Ph.D. in mechanical engineering from the University of North Carolina at Charlotte. He is a Senior Member of IEEE. Contact him at ndubuisi.orji@chips.gov.
研究兴趣
论文共 75 篇作者统计合作学者相似作者
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JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3no. 3 (2023)
Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV (2021)
Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV (2021)
openalex(2018)
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作者统计
#Papers: 74
#Citation: 1215
H-Index: 20
G-Index: 33
Sociability: 5
Diversity: 2
Activity: 2
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