Kevin Jones received the B.S. degree from the University of Florida (UF), Gainesville, in 1980, the M.S. and Ph.D. degrees from the University of California, Berkeley, in 1985 and 1987, respectively. He is currently a Professor of materials science and engineering at UF, where he joined the faculty in 1987. He has spent the past 15 years studying the processing of both microelectronic and photonic devices. He is most renowned in the area of characterization of processing-induced defects after either ion implantation or epitaxial growth. His paper on the defects that arise from ion implantation of silicon is the second most widely cited paper in the field worldwide. He is currently Co-Director of the Software and Analysis of Advanced Materials Processing (SWAMP) center at UF. Dr. Jones has received many awards such as Who's Who in America (2000), the University of Florida Research Professor Award (1998), the Teaching Research and Service Award (1996–1997), Faculty Excellence Award (1994–1995), NSF/Presidential Young Investigator Award (1990–1995), and the College of Engineering Teacher of the Year Award (1990–1991). He has also served on and been elected to numerous technical committees involving the Materials Research Society such as FEP Symposium Organizer (2001), Meeting Chairman (2000), National Secretary, and Member of Executive Committee (1996–1997). He was elected as General Secretary of the International Ion Implantation Technology Organization.