Holm Geisler

Holm Geisler studied physics at the Saarland University. He received the Dr. Rer. Nat. degree in experimental physics from the University of Augsburg, Denmark, in 1996. Subsequent to postdoctoral research on multilayer thin films at the University of Aarhus, and Dresden University of Technology, Dresden, Germany, he joined AMD, Dresden, in 1999. He is Team Leader of the structural analysis group in the Center for Complex Analysis, AMD, responsible for analytical techniques like nanoindentation, X-ray diffraction, and transmission electron microscopy.