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Arnaud Dufour, Jérôme Carron, François Pierron,Matthieu Fongral,David Dangla,Guillaume Bascoul,Françoise Bezerra,Julien Mekki,Florence Malou,Pierre Maillard
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)pp.1-6, (2021)
Sophie Jacquinod,Jean-Michel Reess,Napoléon Nguyen Tuong,Jérôme Parisot,Frédéric Chapron, Kateryna Kiryukhina, Guy Perez,Guillaume Bascoul,Olivier Gilard,Julien Mekki, Marina Heim, Estelle Raynal,
International Symposium for Testing and Failure AnalysisISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis (2020)
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)pp.1-4, (2019)
Microelectronics Reliabilitypp.113498, (2019)
Valerio Sanna Valle, Guy Perez,Guillaume Bascoul, Helene Chauvin, Benoît Viallet,Giovanna Mura, Gian Paolo Apeddu
International Symposium for Testing and Failure AnalysisISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis (2019)
M. Mousnier,G. Bascoul, T. Lombardi, A. Faure, J. Goxe, P. Turpin, H. Kamamen, T. Zirilli, C.C. Ng,V. Bley,T. Lebey
International Symposium for Testing and Failure AnalysisISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis (2018)
2018 International Conference on Radiation Effects of Electronic Devices (ICREED)pp.1-6, (2018)
ISTFA 2017: CONFERENCE PROCEEDINGS FROM THE 43RD INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSISpp.495-500, (2017)
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