Georges Pavlidis

Georges Pavlidis (GS’18) received the Ph.D. degree in mechanical engineering from the Georgia Institute of Technology, Atlanta, GA, USA. He is currently a NRC Post-Doctoral Fellow at the National Institute of Standards and Technology Gaithersburg, MD, USA, where he is focusing on developing new AFM-based characterization techniques for future electronics. His current research interests include assessing the reliability of GaN transistors using optical and electrical techniques.