Chrome Extension
WeChat Mini Program
Use on ChatGLM
VIPCreated with Sketch.
Research Interests

Papers共 7 篇Author StatisticsCo-AuthorSimilar Experts

By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
A 7nm Cmos Technology Platform For Mobile And High Performance Compute Application
S. Narasimha,B. Jagannathan,A. Ogino,D. Jaeger,Brian J. Greene,C. Sheraw, K. Zhao, B. S. Haran,Unoh Kwon, A. K. M. Mahalingam,B. Kannan, B. Morganfeld,J. Dechene,C. Radens, A. Tessier, A. Hassan, H. Narisetty,I. Ahsan,M. Aminpur, C. An,M. Aquilino,A. Arya,Rod Augur, N. Baliga, R. Bhelkar,G. Biery,A. Blauberg, N. Borjemscaia,A. Bryant,L. Cao, V. Chauhan, M. Chen, L. Cheng, J. Choo,C. Christiansen,Tao Chu,B. Cohen, R. Coleman,D. Conklin, S. Crown, A. da Silva,D. Dechene, G. Derderian, S. Deshpande, G. Dilliway, K. Donegan,Manfred Eller, Y. Fan,Q. Fang, A. Gassaria,R. Gauthier,S. Ghosh, G. Gifford,T. Gordon,M. Gribelyuk, G. Han, J.H. Han, K. Han, M. Hasan,J. Higman,J. Holt, L. Hu, L. Huang,C. Huang,T. Hung,Y. Jin, J. Johnson, S. Johnson,V. Joshi,M. Joshi,P. Justison, S. Kalaga,T. Kim, W. Kim,R. Krishnan,B. Krishnan,K. Anil, M. Kumar, J. Lee,R. Lee,J. Lemon,S.L. Liew, P. Lindo,M. Lingalugari, M. Lipinski, P. Liu, Jinping Liu, S. Lucarini,W. Ma,E. Maciejewski, S. Madisetti, A. Malinowski,J. Mehta,C. Meng,S. Mitra, C. Montgomery,H. Nayfeh,T. Nigam,G. Northrop,K. Onishi, C. Ordonio,M. Ozbek,Rohit Pal,Sanjay Parihar,O. Patterson,E. Ramanathan,I. Ramirez,R. Ranjan, J. Sarad,V. Sardesai, S. Saudari, C. Schiller,Biswanath Senapati, C. Serrau, N. Shah,T. Shen,H. Sheng,J. Shepard, Y. Shi,M.C. Silvestre,D. Singh, Z. Song, J. Sporre,P. Srinivasan, Z. Sun,A. Sutton,R. Sweeney,K. Tabakman, M. Tan, X. Wang,E. Woodard, G. Xu, D. Xu, T. Xuan,Y. Yan, J. Yang,K.B. Yeap, M. Yu,A. Zainuddin, J. Zeng, K. Zhang, M. Zhao, Y. Zhong,Rick Carter,Chung-hsun Lin,Stephan Grunow,C. Child, M. Lagus, Robert Fox,E. Kaste, G. Gomba,Srikanth Samavedam,P. Agnello,D. K. Sohn
2017 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)（2017）
Cited55Views0EIWOSBibtex
55
0
Competitive and cost effective copper/low-k interconnect (BEOL) for 28nm CMOS technologies
R. Augur,C. Child, J. H. Ahn,T. J. Tang,L. Clevenger,D. Kioussis, H. Masuda,R. Srivastava, Y. Oda, H. Oguma,R. Quon, B. Kim,H. Sheng, S. Hirooka, R. Gupta, A. Thomas, S. M. Singh,Q. Fang, R. Schiwon,B. Hamieh,E. Wornyo, S. Allen,E. Kaltalioglu,G. Ribes, G. Zhang, T. Fryxell,A. Ogino, E. Shimada, H. Aizawa, H. Minda, S. O. Kim, T. Oki, K. Fujii, M. Pallachalil,T. Takewaki, C. K. Hu,B. Sundlof, D. Permana,T. Bolom,B. Engel,C. Labelle, B. Sapp,T. Nogami, A. Simon, H. Shobha,S. Gates,E. T. Ryan,G. Bonilla,T. Daubenspeck,T. Shaw,G. Osborne,A. Grill,D. Edelstein,D. Restaino,S. Molis, T. Spooner,P. Ferreira,G. Biery,R. Sampson
Periodicals（2012）
Cited3Views0EIBibtex
3
0
Cu/SiLK integration: Influence of process on reliability
V McGahay, C Adams,E Barth,G Biery, Z Chen, X Chen,S Das,C Davis,B Engel,J Fitzsimmons, J Gill,J Gambino, R Geffken,R Goldblatt, L Hadel, B Kastenmeier, W Klaasen,W Landers,S Luce,N Lustig, J Marino, A Martin,T McDevitt, J McGrath,I Melville,D Nguyen, R Procter,H Rathore,SC Seo,T Spooner,A Stamper,T Standaert, C Tian,J Wynne
MATERIALS RESEARCH SOCIETY CONFERENCE PROCEEDINGSpp.3-9, (2001)
Cited0Views0Bibtex
0
0
A 0.18 μm high-performance logic technology
S. Crowder,S. Greco, H. Ng,E. Barth,K. Beyer,G. Biery,J. Connolly,C. DeWan, R. Ferguson, X. Chen,M. Hargrove,E. Nowak, P. McLaughlin, R. Purtell,R. Logan,J. Oberschmidt,A. Ray, D. Ryan,K. Tallman, T. Wagner,V. McGahay,E. Crabbe,P. Agnello,R. Goldblatt,L. Su,B. Davari
1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325) (1999)
Cited9Views0Bibtex
9
0
Author Statistics

#Papers: 8

#Citation: 164

H-Index: 5

G-Index: 6

Sociability: 5

Diversity: 1

Activity: 0

  • 合作者
  • 学生
  • 导师
No result temporarily, you can search similar Scholar with the same research interest
Data Disclaimer
The page data are from open Internet sources, cooperative publishers and automatic analysis results through AI technology. We do not make any commitments and guarantees for the validity, accuracy, correctness, reliability, completeness and timeliness of the page data. If you have any questions, please contact us by email: report@aminer.cn