He is responsible for technology qualification and development of dielectric reliability methodologies. He authored and coauthored more than 100 technical and conference papers with several invited papers and tutorials, as well as 11 IEEE International Electron Device Meeting (IEDM) papers. His research interests include reliability physics, device physics, and carrier transport phenomena.,Dr. Wu has served on the Device Dielectric Committee as the Chair and a Cochair for the 2007 and the 2005 International Reliability Physics Symposium (IRPS), respectively. He is a member of the CMOS and Interconnect Reliability committee of IEDM for 1999 and 2000.