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论文共 53 篇作者统计合作学者相似作者

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Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology
Leitao Liu, Jingtian Fang,Ashish Pal,Plamen Asenov,Mohit Bajaj, Bei Deng,Xi-Wei Lin,Souvik Mahapatra, Subi Kengeri,El Mehdi Bazizi
2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024 (2024)
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GAA Technology Innovations for 2nm Logic Node and Beyond
El Mehdi Bazizi,Gregory Costrini,Ashish Pal,Pratik B. Vyas,Sefa Dag,Charisse Zhao, Priyamvada Jadaun
8TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM 2024pp.729-731, (2024)
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Tungsten Interconnect Resistance Reduction Enabling Energy Efficient and High Performance Applications for 2nm Node and Beyond
Gaurav Thareja,Ashish Pal, Quan Ma,Chi Ching, Sahil Patel,Xingyao Gao,Sefa Dag, Zhimin Qi,Aixi Zhang, Shiyu Yue,Wei Lei,Yi Xu,Yu Lei, Hao Jiang,Shi You, Wenkai Zheng,Raymond Hung,Gregory Costrini, Qing Zhu, Randy Tran, Rohit Gupta,Vinod Reddy,Pratik B. Vyas,Sajjad Hassan, Man Ping Cai,Gang Shen,Zhebo Chen,Wenting Hou,Jianxin Lei,Rongjun Wang, Walters Shen,Sameer Deshpande, Sidney Huey,Jianshe Tang,Mehul Naik,Sree Kesapragada, Buvna Ayyagari-Sangamali,El Mehdi Bazizi,Xianmin Tang
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
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Next Generation Gate-all-around Device Design for Continued Scaling Beyond 2 Nm Logic
Pratik B. Vyas,Charisse Zhao,Sefa Dag,Ashish Pal,El Mehdi Bazizi,Buvna Ayyagari-Sangamalli
2023 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES, SISPADpp.57-60, (2023)
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作者统计

#Papers: 53

#Citation: 815

H-Index: 11

G-Index: 28

Sociability: 5

Diversity: 2

Activity: 22

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