基本信息
views: 45
![](https://originalfileserver.aminer.cn/sys/aminer/icon/show-trajectory.png)
Bio
Geoffrey Yeap (Senior Member, IEEE) received the BSEE, MSEE, and Ph.D. degrees in electrical and computer engineering with a specialization in microelectronics from The University of Texas at Austin, Austin, TX, USA, in 1986, 1988, and 1994, respectively.
He was a Vice President of Engineering at Qualcomm Technologies Inc., in charge of silicon technology and foundry engineering (advanced digital CMOS, RF/analog, PMIC and bump/CPI) and foundry IP/design enablement. He has more than 25 years of semiconductor industry experience working at TSMC, Qualcomm, Motorola, and Advanced Micro Devices on advanced high-performance microprocessor and mobile silicon technology development, new technology/product introduction, as well as design/technology co-optimization. He is currently working at TSMC, Hsinchu, Taiwan, on the flagship advanced technology platform. He has authored more than 55 refereed journal/conference articles and holds more than 90 U.S. and international patents.
Research Interests
Papers共 82 篇Author StatisticsCo-AuthorSimilar Experts
By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
Nick Zhang, Young Suk Kim,Peter Hsu,Samsoo Kim, Derek Tao,Hung-Jen Liao,P. W. Wang,Geoffrey Yeap,Quincy Li,Tsung-Yung Jonathan Chang
IEEE Solid-State Circuits Letters (2024): 6-9
Nick Zhang, Young Suk Kim,Peter Hsu,Samsoo Kim, Derek Tao,Hung-Jen Liao,P. W. Wang,Geoffrey Yeap,Quincy Li,Tsung-Yung Jonathan Chang
IEEE SOLID-STATE CIRCUITS LETTERS (2024): 6-9
Nick Zhang, Young Suk Kim,Peter Hsu,Samsoo Kim, Derek Tao,Hung-Jen Liao,Ping-Wei Wang,Geoffrey Yeap,Quincy Li,Tsung-Yung Jonathan Chang
VLSI Technology and Circuitspp.1-2, (2023)
J. C. Liu,S. Mukhopadhyay,Amit Kundu, S. H. Chen, H. C. Wang,D. S. Huang,J. H. Lee, M. Wang,Ryan Lu,S. S. Lin, Y. M. Chen, H. L. Shang, P. W. Wang,H. C. Lin,Geoffrey Yeap,Jun He
2020 IEEE International Electron Devices Meeting (IEDM)pp.9.2.1-9.2.4, (2020)
international solid-state circuits conferencepp.238-240, (2020)
Geoffrey Yeap,S. S. Lin,Y. M. Chen, H. L. Shang,P. W. Wang, H. C. Lin,Y. C. Peng,J. Y. Sheu,M. Wang,X. Chen,B. R. Yang,C. P. Lin, F. C. Yang,Y. K. Leung,D. W. Lin, C. P. Chen,K. F. Yu,D. H. Chen,C. Y. Chang,H. K. Chen, P. Hung,C. S. Hou,Y. K. Cheng,J. Chang,L. Yuan,C. K. Lin, C. C. Chen,Y. C. Yeo,M. H. Tsai, H. T. Lin,C. O. Chui,K. B. Huang,W. Chang,H. J. Lin,K. W. Chen,R. Chen,S. H. Sun, Q. Fu, H. T. Yang,H. T. Chiang,C. C. Yeh,T. L. Lee,C. H. Wang,S. L. Shue,C. W. Wu,R. Lu,W. R. Lin,J. Wu, F. Lai, Y. H. Wu, B. Z. Tien,Y. C. Huang,L. C. Lu,Jun He,Y. Ku,J. Lin,M. Cao, T. S. Chang,S. M. Jang
2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)pp.36.7.1-36.7.4, (2019)
Load More
Author Statistics
#Papers: 83
#Citation: 1351
H-Index: 23
G-Index: 34
Sociability: 6
Diversity: 2
Activity: 6
Co-Author
Co-Institution
D-Core
- 合作者
- 学生
- 导师
Data Disclaimer
The page data are from open Internet sources, cooperative publishers and automatic analysis results through AI technology. We do not make any commitments and guarantees for the validity, accuracy, correctness, reliability, completeness and timeliness of the page data. If you have any questions, please contact us by email: report@aminer.cn