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论文共 68 篇作者统计合作学者相似作者
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Fabia Farlin Athena, Omobayode Fagbohungbe,Nanbo Gong,Malte J. Rasch, Jimmy Penaloza,Sooncheon Seo,Arthur Gasasira,Paul Solomon,Valeria Bragaglia,Steven Consiglio,Hisashi Higuchi,Chanro Park,
FRONTIERS IN ELECTRONICS (2024)
N. Gong,M. J. Rasch,S. -C. Seo, A. Gasasira,P. Solomon,V. Bragaglia,S. Consiglio, H. Higuchi, C. Park,K. Brew, P. Jamison,C. Catano,
Electrochemical Society Transactionsno. 2 (2021): 19-28
Ruturaj Pujari,Arthur Gasasira,Youngseok Kim, Veenadhar Katragadda,Soon-Cheon Seo,Dexin Kong, Xuefeng Liu,Sean Teehan,Nicole Saulnier,Ishtiaq Ahsan,Vijay Narayanan,Takashi Ando
Y. Kim,S. C. Seo,P. Jamison,S. Consiglio, H. Higuchi,H. Miyazoe,P. Solomon, S. Kim,T. Gokmen,K. Tapily,R. D. Clark, T. Tsunomura,
2021 Silicon Nanoelectronics Workshop (SNW)pp.1-2, (2021)
Advanced Etch Technology for Nanopatterning IX (2020)
J. Li,Y. Kim,D. Kong,K. Cheng,S. -C. Seo, C. Robinson, N. Saulnier,R. R. Robison, A. J. Varghese,I. Ahsan,R. Muralidhar,T. Ando,
International Symposium for Testing and Failure AnalysisISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis (2020)
Dexin Kong,Robinhsinkuo Chao,Mary Breton,Chi-Chun Liu,Gangadhara Raja Muthinti,Soon-Cheon Seo,Nicolas Loubet,Pietro Montanini, John G. Gaudiello,Veeraraghavan S. Basker,Aron Cepler, Susan Ng-Emans,
Metrology, Inspection, and Process Control for Microlithography XXXII (2018): 225-234
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