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Numerical Investigation on the Thermal Resistance and Assembly Cost in SSC and DSC Power Modules

Ciro Scognamillo, Antonio Pio Catalano,Lorenzo Codecasa,Alberto Castellazzi, Vincenzo d’Alessandro

2024 30th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)(2024)

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关键词
Thermal Resistance,Assembly Cost,Layer Thickness,Finite Element Method,Device Resistance,Dielectric Breakdown,Finite Element Method Simulations,Copper Layer,Partial Discharge,Ceramic Layer,Printed Circuit Board,Thick Copper,Power MOSFETs,Heat Spreader
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