Advanced Spectroscopic Methods for Probing In-Gap Defect States in Amorphous SiNx for Charge Trap Memory ApplicationsHyun Don Kim,Minseon Gu, Kyu-Myung Lee, Hanyeol Ahn, Jinwoo Byun, Gukhyon Yon, Junghyun Beak, Hyeongjoon Lim, Jaemo Jung, Jaehyeon Park, Jwa Soon Kim, HaeJoon Hahm, Soobang Kim, Won Ja Min, Moon Seop Hyun, Yun Chang Park, Gyungtae Kim,Yongsup Park, Moonsup Han,Eunjip Choi,Young Jun ChangCurrent Applied Physics（2024）引用 0|浏览0暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
