Compact Modeling and Experimental Validation of Reverse Mode Impact Ionization in LDMOS Transistors Within the BSIM-BULK Framework

Yawar Hayat Zarkob,Ayushi Sharma,Girish Pahwa,Debashish Nandi,Chetan K. Dabhi, Volker Kubrak, Bob Peddenpohl, Mingchun Tang,Chenming Hu,Yogesh Singh Chauhan

8TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM 2024（2024）

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BSIM-BULK,compact modeling,LDMOS,reverse mode,impact ionization

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