Comparative Coherence Between Layered and Traditional Semiconductors: Unique Opportunities for Heterogeneous Integration

Zhuofan Chen,Xiaonan Deng,Simian Zhang,Yuqi Wang,Yifei Wu,Shengxian Ke, Junshang Zhang, Fucheng Liu,Jianing Liu,Yingjie Liu, Yuchun Lin, Andrew Hanna,Zhengcao Li,Chen Wang

INTERNATIONAL JOURNAL OF EXTREME MANUFACTURING（2023）

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heterogeneous integration,van der Waals heterostructure,post Moore era,layered semiconductor,transition metal dichalcogenide,layered-traditional semiconductor heterostructure

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