谷歌浏览器插件
订阅小程序
在清言上使用

Comparison of PMMA Shrinkage in Ion Beam Lithography: PMMA on Glass Substrate Vs Free-Standing PMMA Film

Nuclear instruments and methods in physics research Section B, Beam interactions with materials and atoms/Nuclear instruments & methods in physics research Section B, Beam interactions with materials and atoms(2023)

引用 0|浏览6
暂无评分
摘要
The present work focuses on the shrinkage of PMMA films under irradiation and its application to the creation of optical devices. We prepared the free-standing PMMA films in four different thicknesses (13, 21, 32, and 43 & mu;m), and PMMA films of the same thickness, but deposited on a glass substrate. A diffraction grating was chosen as the optical device to show the applicability of the method. The study revealed that at a film thickness of 13-32 & mu;m, the shrinkage of the free-standing film increases proportionally to its thickness, while the film on the substrate does not have a pronounced dependence. Films with the thickness of 43 & mu;m do not follow this trend. It was found that under the same irradiation conditions, the film on the substrate shrinks more compared to the free-standing film. Interference patterns from the created diffraction gratings were shown to present spurious illumination areas.
更多
查看译文
关键词
PMMA shrinkage,Ion beam lithography,Microstructuring,Diffraction grating
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要