An Equivalent Circuit Model of NBTI Effect for Short-Channel P-MOSFET

Jun-an Zhang,Min Jiang,Jinxin Hu, Yi Xiao,Tiehu Li,Yunhua Lu,Qingwei Zhang

Microelectronics reliability/Microelectronics and reliability（2022）

引用 0|浏览12
暂无评分
关键词
Equivalent circuit model,NBTI,Short-channel P-MOSFET,Long-term reliability design
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要