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Quantification of the Electromechanical Measurements by Piezoresponse Force Microscopy

Pratyush Buragohain,Haidong Lu,Claudia Richter,Tony Schenk,Pamenas Kariuki,Sebastjan Glinsek,Hiroshi Funakubo,Jorge Iniguez,Emmanuel Defay,Uwe Schroeder,Alexei Gruverman

Advanced Materials（2022）

引用 10|浏览20
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关键词
ferroelectric hafnium oxide,negative piezoelectric coefficient,piezoresponse force microscopy,PFM quantification
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