New Approach for Pulsed-Laser Testing That Mimics Heavy-Ion Charge Deposition Profiles

Joel M. Hales,John D. Cressler,Dale McMorrow,Ani Khachatrian,Stephen Buchner,Jeffrey Warner,Adrian Ildefonso,George N. Tzintzarov,Delgermaa Nergui,Daniele M. Monahan,Stephen D. LaLumondiere

IEEE transactions on nuclear science（2020）

引用 18|浏览76

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关键词

Correlation methods,heavy-ion testing,linear energy transfer (LET),pulsed-laser,silicon,single-event effect (SEE),single-event transient (SET),two-photon absorption (TPA)

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