Cryogenic Characterization of RF Low-Noise Amplifiers Utilizing Inverse-Mode SiGe HBTs for Extreme Environment Applications
IEEE transactions on device and materials reliability（2018）
关键词
Cascode,cryogenic measurement,extreme environment,heterojunction bipolar transistor (HBT),inverse mode,low-noise amplifier (LNA),silicon-germanium (SiGe)
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