基本信息
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职业迁徙
个人简介
Yuk Tsang received the B.S. degree from the University of California, Berkeley, CA, USA, the M.S. degree from San Jose State University, San Jose, CA, USA, and was a Ph.D. candidate, under the IBM Graduate Work-Study Program, at the Rensselaer Polytechnic Institute, Troy, NY, USA, all in electrical engineering.
He was within the semiconductor industry in Silicon Valley, CA, USA, while he was a graduate student. He then joined IBM, East Fishkill, NY, USA, as an Advisory Engineer, Motorola, Austin, TX, USA, as a Senior Principal Staff Scientist, and now Freescale Semiconductor, Inc., Austin, as a Senior Member of Technical Staff. His experience has been in CMOS and bipolar device characterization, process integration, yield enhancement, test vehicle design and design rules, diagnostics, and failure analysis. He has 15 refereed articles and 21 invention disclosures published, including U.S. patents. He currently focuses on atomic force nano-probing.
研究兴趣
论文共 10 篇作者统计合作学者相似作者
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期刊级别
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合作机构
International Symposium for Testing and Failure AnalysisISTFA 2014: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis (2014)
ISTFA 2012: CONFERENCE PROCEEDINGS FROM THE 38TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS (2012)
ISTFA 2012: CONFERENCE PROCEEDINGS FROM THE 38TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS (2012)
Proceedings - International Symposium for Testing and Failure Analysis (2011)
ISTFA 2010: CONFERENCE PROCEEDINGS FROM THE 36TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSISpp.66-70, (2010)
International Symposium for Testing and Failure AnalysisISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis (2010)
Proceedings - International Symposium for Testing and Failure Analysis (2010)
作者统计
#Papers: 10
#Citation: 6
H-Index: 2
G-Index: 2
Sociability: 2
Diversity: 1
Activity: 0
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