Yaw S. Obeng

Yaw S. Obeng is currently a Leader of the Back-End-of-Line Reliability Project, and the Co-ordinator of the Device Reliability Center with the Semiconductor and Dimensional Metrology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA. He is a Fellow of the American institute of Chemists, and Chartered Chemist, and a Member of the Royal Society of Chemistry.