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职业迁徙
个人简介
Involved in device and circuit reliability modeling and product qualification tests.
研究兴趣
论文共 175 篇作者统计合作学者相似作者
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Ryuichi Nakajima,Takafumi Ito,Shotaro Sugitani, Tomoya Kii,Mitsunori Ebara,Jun Furuta, Kazutoshi Kobayashi,Mathieu Louvat,Francois Jacquet, Jean-Christophe Eloy,Olivier Montfort,Lionel Jure,Vincent Huard
IEICE TRANSACTIONS ON ELECTRONICSno. 7 (2024): 191-200
ISSCCpp.326-327, (2023)
2023 International Conference on IC Design and Technology (ICICDT)pp.xi-xi, (2023)
Shotaro Sugitani,Ryuichi Nakajima,Takafumi Ito,Jun Furuta, Kazutoshi Kobayashi,Mathieu Louvat,Francois Jacquet, Jean-Christophe Eloy,Olivier Montfort,Lionel Jure,Vincent Huard
IEEE International Symposium on On-Line Testing and Robust System Designpp.1-5, (2023)
V. Huard, F. Jacquet,S. Mhira, L. Jure,O. Montfort, M. Louvat, L. Zaia, F. Bertrand, E. Acacia, O. Caffin, H. Belhadj, O. Durand, N. Exibard, V. Bonnet, A. Charvier,P. Bernardi,R. Cantoro
2022 IEEE International Reliability Physics Symposium (IRPS) (2022)
Sidina Wane, Fabien Ferrero, Thanh Vinh Dinh, Damienne Bajon, Lionel Duvillaret, Gwenael Gaborit,Vincent Huard
Electronicsno. 7 (2022): 1134-1134
L. Degli Abbati,R. Ullmann, G. Paganini,M. Coppetta, L. Zaia,V Huard,O. Montfort,R. Cantoro,G. Insinga,F. Venini, P. Calao,P. Bernardi
2021 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems (WMCS)pp.1-4, (2021)
2021 IEEE International Solid- State Circuits Conference (ISSCC) (2021): 492-494
Recent Advances in PMOS Negative Bias Temperature Instabilitypp.173-197, (2021)
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作者统计
#Papers: 176
#Citation: 3993
H-Index: 29
G-Index: 58
Sociability: 6
Diversity: 1
Activity: 0
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