Tomás Martínek

Tomas Martinek received the Ph.D. degree from the Faculty of Applied Informatics, Tomas Bata University (TBU) in Zlín, in September 2019. His Ph.D. dissertation “Diagnostic Methods for Percolation Threshold Determination of Ultra-Thin Tungsten Layers.” He has been with the CEBIA-Tech Research Center as a Junior Researcher, since 2014. He joined the Department of Electronics and Measurements, TBU in Zlín, in 2019, as an Academician Senior Lecturer. His research interests include material properties, with an emphasis on novel materials and nanomaterials and microscopical methods, including scanning probe microscopy and electron microscopy.