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研究兴趣

论文共 59 篇作者统计合作学者相似作者

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Characterization and Customization of Individual EDS Detectors to Improve X-ray Microanalysis of Light Elements
Philippe T Pinard,Simon Burgess, John Qing Zhang, Peter J Statham
Microscopy and Microanalysisno. Supplement_1 (2024)
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The Installation and Operation of SEM-EDS Analysis in a Regulated Environment
Anthony Hyde,Simon Burgess,Haithem Mansour, Edward Jackson,Michael Hjelmstad
Microscopy and Microanalysisno. Supplement_1 (2024)
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Development and Applications of Backscattered Electron and X-ray Detector
Macarthur Katherine,Mansour Haithem, Zhang John,Hyde Anthony,Burgess Simon,Pinard Philippe
BIO Web of Conferences (2024): 06025
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High-temperature EDS and EBSD Analysis – Enabling in Situ Heating for Direct Observation of Phase Transformations in the SEM
Haithem Mansour,Simon Burgess,Patrick Trimby,Kim Larsen,Jack Donoghue, Jiaqi Xu, Albert Smith
Microscopy and microanalysis the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canadano. Supplement_1 (2023): 2085-2086
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Use of Spectrum Simulation to Acquire Reliable Scans with a Wavelength Dispersive Spectrometer
Philippe Pinard,Rosie Jones,Lucia Spasevski,Simon Burgess,Peter Statham
Microscopy and microanalysis the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canadano. Supplement_1 (2023): 81-82
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Getting the Best Spatial Resolution by Using Low Kv EDS in FIB Workflows
Dan Haspel,Michael Hjelmstad,Simon Burgess,Haithem Mansour
Microscopy and microanalysis the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canadano. Supplement_1 (2023): 549-550
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作者统计

#Papers: 59

#Citation: 409

H-Index: 6

G-Index: 20

Sociability: 5

Diversity: 1

Activity: 2

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