Si Joon Kim

基本信息

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职业迁徙

个人简介

Si Joon Kim received the M.S. and Ph.D. degrees from the School of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea, in 2010 and 2014, respectively. He is currently a Post-Doctoral Researcher with the Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, TX, USA.

研究兴趣

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Impact of Tetrakis(ethylmethylamino)-based Precursor and Oxygen Source Selection on Atomic Layer Deposition of Ferroelectric HfxZr1-xO2 Thin Films

Jin-Hyun Kim, Siun Song, Dushyant M. Narayan,Dan N. Le, Thi Thu Huong Chu, Minjong Lee, Geon Park, Seungbin Lee, Jongmug Kang,Jeffrey Spiegelman,Marshall Benham,Si Joon Kim,Rino Choi,Jiyoung Kim

APPLIED SURFACE SCIENCE (2025)

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BEOL Compatible Ultra-Low Operating Voltage (0.5 V) and Preconfigured Switching Polarization States in Effective 3 Nm Ferroelectric HZO Capacitors