Robert L Franch

Robert L. Franch received the B.S.E.E. degree from the Polytechnic Institute of New York, Brooklyn, in 1980. He joined IBM East Fishkill, NY, in 1980, where he worked on bipolar device reliability and stress testing of VLSI devices and interconnects. In 1984, he joined IBM Research as a member of the Test Systems Group where he worked on high speed functional testing of NMOS and CMOS chips developed at IBM Research. In 1993, he joined the VLSI Design Group, IBM T. J. Watson Research Center, Yorktown Heights, NY, where he has worked on circuit design for microprocessors. He has since been engaged in the design of CMOS circuit macros and has contributed to several generations of IBM S/390 microprocessors.