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个人简介
Ming-Kun Chen was born in Taiwan, R.O.C., in 1968. He received the B.S. degree in electronic engineering from National Yunlin University of Science and Technology, Yunlin, Taiwan, and the M.S. degree in electronic engineering from I-Shou University, Kaohsiung, Taiwan, in 1995 and 2002, respectively. He is currently working toward the Ph.D. degree in the nondestructive evaluation (NDE) Laboratory of the Electrical Engineering Department, Cheng Kung University, Tainan, Taiwan.
From 1996 to 2002, he worked at Advanced Semiconductor Engineering Test (ASET) Ltd., Kaohsiung, where he performed IC testing interface and tester technology improvement. His research interests are in the areas of high-speed measurement, modeling, simulation methodology of packaging, failure analysis of IC packaging/testing, analysis of signal integrity, and nondestructive testing.
Mr. Chen is a Student Member of the Institute of Electrical, Information, and Communication Engineers (IEICE) Society.
研究兴趣
论文共 65 篇作者统计合作学者相似作者
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#Papers: 64
#Citation: 754
H-Index: 18
G-Index: 25
Sociability: 4
Diversity: 3
Activity: 0
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