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个人简介
Francois Marc received the PhD degree in 1994 and the professoral dissertation in 2008. He has been an associate professor in the Laboratoire de l ‘Intégration du Matériau au Systeme (IMS) since 1995. From 1990 to 1999, he worked on the development of methods for fast localization of defects inside logic integrated circuits using electron beam test, in the context of failure analysis. Since 1999, he has initiated and is responsible for the research activities of prediction of electronic circuits reliability during the design phase at IMS. His research interests include the modelling and the simulation of the aging mechanisms of electronic devices and their effects on circuits reliability, using behavioural and compact modelling languages such as VHDL-AMS and Verilog-A, and statistical analysis. He was vice-chairman of the European Symposium on Reliability of Electron devices, Failure physics an analysis (ESREF) in 2013. He was technical program chairman of the conference in 2009, 2011, and 2015, respectively.
研究兴趣
论文共 40 篇作者统计合作学者相似作者
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Louise Dumas, Guillaume Bascoul,François Marc, Hélène Fremont, Christina Villeneuve-Faure, Christophe Guerin
2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)pp.01-07, (2024)
Ian O'Connor,Sara Mannaa,Alberto Bosio,Bastien Deveautour,Damien Deleruyelle, Tetiana Obukhova,Cédric Marchand,Jens Trommer,Cigdem Cakirlar,Bruno Neckel Wesling,Thomas Mikolajick,Oskar Baumgartner,Mischa Thesberg,David Pirker, Christoph Lenz,Zlatan Stanojevic,Markus Karner,Guilhem Larrieu,Sylvain Pelloquin, Konstantinous Moustakas,Jonas Muller,Giovanni Ansaloni,Alireza Amirshahi,David Atienza,Jean-Luc Rouas,Leila Ben Letaifa, Georgeta Bordeall, Charles Brazier,Chhandak Mukherjee,Marina Deng, Yifan Wang,Marc Francois,Houssem Rezgui,Reveil Lucas,Cristell Maneux
2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)pp.1-6, (2024)
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Ian O'Connor,Sara Mannaa,Alberto Bosio,Bastien Deveautour,Damien Deleruyelle, Tetiana Obukhova,Cédric Marchand,Jens Trommer,Çigdem Çakirlar,Bruno Neckel Wesling,Thomas Mikolajick,Oskar Baumgartner,Mischa Thesberg,David Pirker, Christoph Lenz,Zlatan Stanojevic,Markus Karner,Guilhem Larrieu,Sylvain Pelloquin, Konstantinous Moustakas,Jonas Müller,Giovanni Ansaloni,Alireza Amirshahi,David Atienza,Jean-Luc Rouas,Leila Ben Letaifa, Georgeta Bordeall, Charles Brazier,Chhandak Mukherjee,Marina Deng, Yifan Wang,Marc François,Houssem Rezgui,Reveil Lucas,Cristell Maneux
Design, Automation, and Test in Europepp.1-6, (2024)
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Louise Dumas,Christina Villeneuve-Faure,Francois Marc,Helene Fremont, Christophe Guerin,Guillaume Bascoul
Microelectronics reliability/Microelectronics and reliability (2023): 115102-115102
Microelectronics reliability/Microelectronics and reliability (2023): 115007-115007
2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC)pp.1-2, (2022)
MICROELECTRONICS RELIABILITY (2022)
2021 IEEE BICMOS AND COMPOUND SEMICONDUCTOR INTEGRATED CIRCUITS AND TECHNOLOGY SYMPOSIUM (BCICTS) (2021)
J. D. Aguirre-Morales,F. Marc
Chhandak Mukherjee, Marina Deng,Francois Marc,Cristell Maneux,Arnaud Poittevin, Ian O'Connor,Sebastien Le Beux, Cedric Marchand,Abhishek Kumar,Aurae Lecestre,Guilhem Larrieu
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作者统计
#Papers: 40
#Citation: 224
H-Index: 9
G-Index: 13
Sociability: 5
Diversity: 0
Activity: 0
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