Mustapha Rafik

Mustapha Rafik received the B.Eng. degree in physics from the Institute National Polytechnique de Grenoble (INPG), Grenoble, France, the M.S.E.E. degree in micro- and nanoelectronics from Joseph Fourier University, Grenoble, in 2005, and the Ph.D. degree in micro- and nanoelectronics from INPG in 2008. He is currently a Senior Reliability Engineer with the Reliability Department, STMicroelectronics, Crolles, France. He works in the area of advanced gate stack reliability. Dr. Rafik also serves as a Reviewer for different journals and international conferences (TED, MR, and IRPS).