Leticia B. Poehls

Leticia Maria Bolzani Poehls (Member, IEEE) received the M.Sc. degree in electrical engineering from the Pontifical Catholic University of Rio Grande do Sul (PUCRS), Porto Alegre, Brazil, in 2004, and the Ph.D. degree in computer engineering from the Politecnico di Torino, Turin, Italy, in 2004. She is an Associate Professor at the School of Engineering, PUCRS. She is also a Guest Researcher at the Chair of Integrated Digital Systems and Circuit Design, RWTH Aachen University, Aachen, Germany, working on developing test strategies for resistive RAMs (RRAMs). Her fields of interest include testing and fault tolerance of integrated systems and emerging technologies, power-, aging- and temperature-aware IC design, and the development of EDA tools for IC optimization. Dr. Poehls is a technical committee member of several IEEE-sponsored conferences and a member of the Latin American Test Symposium (LATS) Steering Committee. Finally, she is a Coordinating Editor of the Journal of Electronic Testing: Theory and Application (JETTA).