谷歌浏览器插件
订阅小程序
在清言上使用
VIPCreated with Sketch.
研究兴趣

论文共 63 篇作者统计合作学者相似作者

按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
A Systematic Study of HCI Improvement in FinFET with Source/Drain Implant and Geometry Modulation
Rakesh Ranjan, Pavitra R. Perepa,Ki-Don Lee,Ashish Kumar Jha, Kartika C. Sahoo, Kayla N. Sanders, Robert Moeller, Prateek Sharma,Minhyo Kang, Peter Kim, Kwanjae Song, Yongwoo Jeon, Seungho Kim,Hyewon Shim,Shin-Young Chung, Ju Kwang Kim
2024 IEEE International Reliability Physics Symposium (IRPS)pp.5A.1-1-5A.1-6, (2024)
引用0浏览0EIWOS引用
0
0
Impacts of Post-Cu CMP Queue Time on Reliability
Yinghong Zhao,Hokyung Park,Ki-Don Lee, Liangshan Chen,Manisha Sharma, Sugento Huandra, Hanson Mao, Brian Filemyr Smith, Wei Xia, Joonah Yoon, Junehwan Kim,Myungsoo Yeo,Shin-Young Chung, Ju Kwang Kim
IEEE International Reliability Physics Symposiumpp.1-5, (2024)
引用0浏览0EIWOS引用
0
0
Polarity Dependency of MOL-TDDB in FinFET
Manisha Sharma,Hokyung Park,Yinghong Zhao,Ki-Don Lee, Liangshan Chen, Joonah Yoon,Rakesh Ranjan, Caleb Dongkyan Kwon,Hyewon Shim,Myungsoo Yeo,Shin-Young Chung,Jon Haefner
IRPSpp.1-3, (2023)
引用0浏览0EIWOS引用
0
0
Impact of Barrier Metal Thickness on SRAM Reliability
Rakesh Ranjan, Pavitra Ramadevi Perepa,Ki-Don Lee,Hokyung Park, Peter Kim, Ganesh Chakravarthy Yerubandi,Jon Haefner, Caleb Dongkyun Kwon,Minjung Jin, Wenhao Zhou,Hyewon Shim,Shin-Young Chung
IRPSpp.1-6, (2023)
引用0浏览0EIWOS引用
0
0
Polarity Dependence and Metal Density Impact on Multi-Layer Inter-Level TDDB for High Voltage Application
Yinghong Zhao,Ki-Don Lee,Manisha Sharma, Joonah Yoon,Rakesh Ranjan,Iqbal Mahmud, Caleb Dongkyan Kwon,Myung Soo Yeo
2022 IEEE International Reliability Physics Symposium (IRPS) (2022)
引用1浏览0EIWOS引用
1
0
Reverse Body Bias Dependence of HCI Reliability in Advanced FinFET
Md Iqbal Mahmud,Rakesh Ranjan,Ki-Don Lee, Pavitra Ramadevi Perepa, Caleb Dongkyun Kwon,Seungjin Choo,Kihyun Choi
2022 IEEE International Reliability Physics Symposium (IRPS) (2022)
引用3浏览0EIWOS引用
3
0
Systematic Study of Process Impact on FinFET Reliability
Rakesh Ranjan,Ki-Don Lee,Md Iqbal Mahmud, Mohammad Shahriar Rahman, Pavitra Ramadevi Perepa, Charles Briscoe Larow, Caleb Dongkyun Kwon, Maihan Nguyen,Minhyo Kang,Ashish Kumar Jha, Ahmed Shariq, Shamas Musthafa Ummer, Susannah Laure Prater,Hyunchul Sagong,HwaSung Rhee
2021 IEEE International Reliability Physics Symposium (IRPS)（2021）
引用2浏览0EIWOS引用
2
0
Trap Density Modulation for IO FinFET NBTI Improvement
Rakesh Ranjan, Charles B. LaRow,Ki-Don Lee,Minhyo Kang, Pavitra R. Perepa, M. Shahriar Rahman, Bong Ki Lee, David Moreau, Carolyn Cariss Daniels, Timothy Basford, Colby Callahan, Maihan Nguyen, Gil Heyun Choi,Hyunchul Sagong,HwaSung Rhee
2020 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)（2020）
引用2浏览0EIWOS引用
2
0
加载更多
作者统计

#Papers: 64

#Citation: 1187

H-Index: 23

G-Index: 33

Sociability: 5

Diversity: 2

Activity: 1

  • 合作者
  • 学生
  • 导师
暂无相似学者，你可以通过学者研究领域进行搜索筛选
数据免责声明
页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果，我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问，可以通过电子邮件方式联系我们：report@aminer.cn