K. Romanjek

Krunoslav Romanjek was born in Chambéry, France, in 1977. He received the M.Sc. degree in physics and nanoelectronics from the University Joseph Fourier, Grenoble, France, in 2001 and the Ph.D. degree in physics and nanoelectronics from the Institut National Polytechnique de Grenoble, Grenoble, in 2004. During his Ph.D. studies in the Institut de Micro-Electronique et de Photonique, Grenoble, he worked on the characterization and modeling of advanced CMOSFETs for 45-nm technology and beyond in collaboration with CEA–LETI and STMicroelectronics. In 2005, he joined the STMicro-PHILIPS-FREESCALE Crolles2 Alliance as a Research & Development Staff Member working on electrical characterization of emerging technologies. Since 2007, he has been with CEA–LETI, Minatec, Grenoble, as a Research Staff Member, working on electrical characterization and modeling of germanium-based devices. He is the author or coauthor of more than 20 papers on the CMOSFET characterization and modeling area.