基本信息
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个人简介
Jeff Simmons (jeff.simmons.3@afresearchlab.com) received his Ph.D. degree in materials science and engineering in 1992 from Carnegie Mellon University, Pittsburgh, Pennsylvania. He is a materials and imaging scientist at the Materials and Manufacturing Directorate of the Air Force Research Laboratory (AFRL), Wright-Patterson, Ohio, 45433, USA. In 1998, he joined AFRL as a research scientist. He served on the Technical Committee for Computational Imaging for the IEEE Signal Processing Society. His research interests include computational imaging for microscopy, for which he has developed advanced algorithms for the analysis of large image data sets; physics-based modeling of microstructure formation; atomistic modeling of defect properties; and computational thermodynamics. He is a member of the Association for Computing Machinery and a Senior Member of IEEE.
研究兴趣
论文共 114 篇作者统计合作学者相似作者
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Physical review Eno. 3 (2023)
arXiv (Cornell University) (2023)
Statistical Methods for Materials Sciencepp.3-12, (2019)
crossref(2019)
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作者统计
#Papers: 114
#Citation: 2955
H-Index: 26
G-Index: 52
Sociability: 5
Diversity: 1
Activity: 0
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