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个人简介
James E. Doran received the B.S. degree in ceramic engineering science from the New York State College of Ceramics at Alfred University, Alfred, NY, USA, in 1994.
He is a Lithography Process Engineer, responsible for Canon steppers, which are used to manufacture and develop CCD image sensors for high performance applications. He is also responsible for Hitachi SEMs for critical dimension control and characterization of new processes and devices.
研究兴趣
论文共 6 篇作者统计合作学者相似作者
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Shen Wang, Richard Brolly,Douglas A. Carpenter,Adam DeJager,James E. Doran,Robert P. Fabinski, Tom Frank, Ryan Kather,Stephen Kosman, Alden Lum, John McCarten,Eric J. Meisenzahl, Peter Mersich,Eric Stevens, Joseph Summa,Cristian Tivarus, Brian Tobey
Shen Wang,Douglas A Carpenter,Adam Dejager,James A Dibella,James E Doran,Robert P Fabinski, Andrew Garland, James A Johnson, Ryan Yaniga
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (2008)
作者统计
#Papers: 6
#Citation: 60
H-Index: 3
G-Index: 5
Sociability: 3
Diversity: 1
Activity: 0
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