基本信息
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职业迁徙
个人简介
Jacopo Franco received the B.Sc. and M.Sc. degrees in electrical engineering from the University of Calabria, Italy, in 2005 and 2008, respectively, and the Ph.D. degree in electrical engineering from KU Leuven, Belgium, in 2013. He is currently a Principal Member of Technical Staff with the Reliability Group, IMEC, Belgium. His research interests include CMOS FEOL reliability characterization, optimization, and modeling. He has (co)authored more than 250 contributed or invited papers and three patents. He was a recipient of seven IEEE awards. He has been serving in various functions on the committees of IRPS, SISC, IIRW, ESREF, WoDiM, and INFOS conferences. He was an Associate Editor of IEEE Transactions on Device and Materials Reliability and IEEE Transactions on Electron Devices.
研究兴趣
论文共 310 篇作者统计合作学者相似作者
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Y. Guo, R. Degraeve,Michiel Vandemaele,Pablo Saraza-Canflanca,Jacopo Franco,Ben Kaczer,Erik Bury, Ingrid Verbauwhede
IEEE International Reliability Physics Symposiumpp.1-7, (2024)
Solid-State Electronicspp.108929, (2024)
IEEE transactions on electron devices/IEEE transactions on electron devicespp.1-7, (2024)
IEEE International Reliability Physics Symposium (2024)
Barry O’Sullivan, A. Alian, A. Sibaja-Hernandez,J. Franco,Sachin Yadav,Yú Hónɡ,Amit Rathi,Uthayasankaran Peralagu,Adrian Chasin, Bertrand Parvais,Nadine Collaert
openalex(2024)
Barry J. O'Sullivan,AliReza Alian, Arturo Sibaja Hernandez,Jacopo Franco,Sachin Yadav,Hao Yu, A. Rathi,Uthayasankaran Peralagu,Adrian Vaisman Chasin,Bertrand Parvais,Nadine Collaert
2024 IEEE International Reliability Physics Symposium (IRPS)pp.1-9, (2024)
Pietro Rinaudo,Adrian Vaisman Chasin, Ying Zhao,Ben Kaczer,Nouredine Rassoul, Harold Dekkers,Michiel J. van Setten,Attilio Belmonte,Ingrid De Wolf,Gouri Sankar Kar,Jacopo Franco
IEEE International Reliability Physics Symposiumpp.1-6, (2024)
SOLID-STATE ELECTRONICS (2024)
Ying Zhao, Pietro Rinaudo,Adrian Vaisman Chasin,Brecht Truijen,Ben Kaczer,Nouredine Rassoul,Harold Dekkers,Attilio Belmonte,Ingrid De Wolf,Gouri Sankar Kar,Jacopo Franco
IEEE International Reliability Physics Symposiumpp.1-7, (2024)
Solid-state electronics (2024): 108881-108881
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作者统计
#Papers: 311
#Citation: 4921
H-Index: 35
G-Index: 59
Sociability: 7
Diversity: 2
Activity: 18
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