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个人简介
Ilsub Chung was born in Jinju, Korea, in 1957. He received the B.S. degree in electronic engineering from SungKyunKwan University, Kyungki-Do, Korea, in 1981, and the M.S. and Ph.D. degrees in electrical and computer engineering from the University of Texas at Austin in 1988 and 1992, respectively.
In 1993, he joined the FRAM project team of the Samsung Advanced Institute of Technology, Giheung, Korea. In 2001, he joined SungKyunKwan University, where he is currently an Associate Professor in the School of Electrical and Computer Engineering, In addition, he currently serves as a secretary of TC47/IEC. His main research area is the characterization of nonvolatile memories such as FRAM, MRAM, and SONOS.
研究兴趣
论文共 118 篇作者统计合作学者相似作者
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Proceedings - International Symposium for Testing and Failure Analysis (2020)
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作者统计
#Papers: 119
#Citation: 1595
H-Index: 23
G-Index: 37
Sociability: 5
Diversity: 3
Activity: 0
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