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    • Research Interests

    Papers共 52 篇Patents共 88 篇Author StatisticsCo-AuthorSimilar Experts

    By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
    时间
    引用量
    主题
    期刊级别
    合作者
    合作机构
    Unique Spectral Interferometry Solutions for Complex High Aspect Ratio 3D NAND Structures
    Jaesuk Yoon, Jongmin Park, Minjung Shin,Dongchul Ihm, Oshrat Bismuth, Smadar Ferber,Jacob Ofek,Igor Turovets, Isaac Kim
    METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVIII (2024)
    Cited0Views0Bibtex
    0
    0
    Wafer-scale Characterization for Two-Dimensional Material Layers
    A. Moussa,J. Bogdanowicz,B. Groven,P. Morin, M. Beggiato,M. Saib, G. Santoro, Y. Abramovitz, K. Houchens, S. Ben Nissim, N. Meir,J. Hung, A. Urbanowicz,R. Koret,I. Turovets, B. Lee, W. T. Lee,G. F. Lorusso,A. -L. Charley
    JAPANESE JOURNAL OF APPLIED PHYSICSno. 3 (2024)
    Cited0Views0Bibtex
    0
    0
    Spectral Interferometry for Fully Integrated Device Metrology
    Daniel Schmidt,Manasa Medikonda,Michael Rizzolo, Claire Silvestre,Julien Frougier,Andrew Greene,Mary Breton,Aron Cepler,Jacob Ofek, Itzik Kaplan,Roy Koret,Igor Turovets
    Journal of Micro/Nanopatterning Materials and Metrologyno. 03 (2023)
    Cited0Views0Bibtex
    0
    0
    300Mm In-Line Metrologies for the Characterization of Ultra-Thin Layer of 2D Materials
    A. Moussa,J. Bogdanowicz,B. Groven,P. Morin, M. Beggiato,M. Saib, G. Santoro, Y. Abramovitz, K. Houchens, S. Ben Nissim, N. Meir,J. Hung, A. Urbanowicz,R. Koret,I. Turovets,G. F. Lorusso,A. -L. Charley
    METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII (2023)
    Cited0Views0Bibtex
    0
    0
    Vertical Travelling Scatterometry for Metrology on Fully Integrated Devices
    D. Schmidt,M. Medikonda,M. Rizzolo, C. Silvestre,J. Frougier,A. Greene,M. Breton, A. Cepler, J. Ofele, I Kaplan,R. Koret,I Turovets
    Metrology, Inspection, and Process Control XXXVI (2022)
    Cited4Views0Bibtex
    4
    0
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    Author Statistics
    00.20.40.60.81#Papers#CitationH-IndexG-IndexSociabilityDiversityActivity

    #Papers: 52

    #Citation: 522

    H-Index: 12

    G-Index: 22

    Sociability: 5

    Diversity: 2

    Activity: 2

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