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Papers共 52 篇Patents共 88 篇Author StatisticsCo-AuthorSimilar Experts
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2024 IEEE 10th Electronics System-Integration Technology Conference (ESTC)pp.1-5, (2024)
ECS Meeting Abstractsno. 32 (2024): 2302-2302
Jaesuk Yoon, Jongmin Park, Minjung Shin,Dongchul Ihm, Oshrat Bismuth, Smadar Ferber,Jacob Ofek,Igor Turovets, Isaac Kim
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVIII (2024)
Stefan Schoeche,Daniel Schmidt, Junwon Han, Shahid Butt, Katherine Sieg,Marjorie Cheng,Aron Cepler, Shaked Dror,Jacob Ofek, Ilya Osherov,Igor Turovets
A. Moussa,J. Bogdanowicz,B. Groven,P. Morin, M. Beggiato,M. Saib, G. Santoro, Y. Abramovitz, K. Houchens, S. Ben Nissim, N. Meir,J. Hung, A. Urbanowicz,R. Koret,I. Turovets, B. Lee, W. T. Lee,G. F. Lorusso,A. -L. Charley
JAPANESE JOURNAL OF APPLIED PHYSICSno. 3 (2024)
Daniel Schmidt,Manasa Medikonda,Michael Rizzolo, Claire Silvestre,Julien Frougier,Andrew Greene,Mary Breton,Aron Cepler,Jacob Ofek, Itzik Kaplan,Roy Koret,Igor Turovets
Journal of Micro/Nanopatterning Materials and Metrologyno. 03 (2023)
A. Moussa,J. Bogdanowicz,B. Groven,P. Morin, M. Beggiato,M. Saib, G. Santoro, Y. Abramovitz, K. Houchens, S. Ben Nissim, N. Meir,J. Hung, A. Urbanowicz,R. Koret,I. Turovets,G. F. Lorusso,A. -L. Charley
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII (2023)
D. Schmidt,M. Medikonda,M. Rizzolo, C. Silvestre,J. Frougier,A. Greene,M. Breton, A. Cepler, J. Ofele, I Kaplan,R. Koret,I Turovets
Metrology, Inspection, and Process Control XXXVI (2022)
Metrology, Inspection, and Process Control XXXVI (2022)
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Author Statistics
#Papers: 52
#Citation: 522
H-Index: 12
G-Index: 22
Sociability: 5
Diversity: 2
Activity: 2
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