Ian Maclaren's research concentrates on using electron microscopy to study the structure and chemistry of materials and devices at the nanoscale and below.
Current research mainly uses either:
Quantitative electron energy loss spectroscopy including DualEELS and ultra-high energy loss spectroscopy
and/or
Scanned diffraction and 4D-STEM using fast, pixelated, direct electron detectors
These techniques are applied to a wide range of topics and materials including functional oxides, high-strength steels, optical coatings for high precision interferometry, infrared semiconductor devices, and mineral alteration in terrestrial and extraterrestrial processes.