谷歌浏览器插件
订阅小程序
在清言上使用
VIPCreated with Sketch.
研究兴趣

论文共 25 篇作者统计合作学者相似作者

按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
Measurement of Neutron-induced Single Event Upset Cross-Section of UltraScale Kintex FPGA Using Time-of-Flight Technique
Yao Teng,Changqing Feng,Zhixin Tan, Zhengtao Liu, Zhizhen Qin, Songsong Tang,Ruirui Fan,Bin Zhou,Zhiliang Hu,Lei Zhao,Shubin Liu, Haofan Bai, Jiangbo Bai, Jie Bao,Ping Cao,Qiping Chen,Yonghao Chen, Wenhao Duan,Anchuan Fan,Minhao Gu, Changcai Han, Zijie Han, Guozhu He,Yongcheng He, Yang Hong,Yiwei Hu, Hanxiong Huang,Wei Jiang,Zhijie Jiang,Ling Kang,Changlin Lan, Bo Li, Feng Li,Qiang Li,Xiao Li,Yang Li,Jie Liu,Rong Liu, Yina Liu, Guangyuan Luan,Changjun Ning, Yijia Qiu,Jie Ren, Wenkai Ren, Zhizhou Ren,Xichao Ruan, Zhaohui Song,Kang Sun, Jingyu Tanga, Shengda Tang, Jincheng Wang, Lijiao Wang, Pengcheng Wang, Zhaohui Wang, Zhongwei Wen,Xiaoguang Wu,Xuan Wu, Zepeng Wu,Cong Xia, Likun Xie,Han Yi,Tao Yu, Yongji Yu,Guohui Zhang, Hangchang Zhang,Qiwei Zhang, Xianpeng Zhang,Yuliang Zhang,Zhiyong Zhang, Maoyuan Zhao, Zhihao Zhou,Kejun Zhu, Chong Zou
IEEE Transactions on Nuclear Scienceno. 99 (2024): 1-1
引用0浏览0EIWOS引用
0
0
Impact of Proton-Induced Total Ionizing Dose Effects on Electrical Characteristics and Safe Operating Area of Trench Field-Stop IGBT Devices
Zhenhua Liu, Xiaofeng Huang,Lihua Mo,Zhiliang Hu, Mao Lin, Lina Qi,Haibin Wang
Microelectronics reliability/Microelectronics and reliability (2024): 115326-115326
引用0浏览0引用
0
0
加载更多
作者统计

#Papers: 26

#Citation: 79

H-Index: 5

G-Index: 8

Sociability: 5

Diversity: 2

Activity: 11

  • 合作者
  • 学生
  • 导师
暂无相似学者，你可以通过学者研究领域进行搜索筛选
数据免责声明
页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果，我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问，可以通过电子邮件方式联系我们：report@aminer.cn