Horng-Chih Lin

Horng-Chih Lin (S'91–M'95–SM'01) was born in I-Lan, Taiwan, R.O.C., on August 1, 1967. He received the B.S. degree from the Department of Physics, National Central University, Chung-Li, Taiwan, R.O.C., in 1989 and the Ph.D. degree from the Institute of Electronics, National Chiao-Tung University (NCTU), Hsinchu, Taiwan, R.O.C., in 1994. From 1994 to 2004, he was with the National Nano Device Laboratories (NDL), Taiwan, R.O.C., where he was engaged in the research projects of nanoscale device technology development. He joined the faculty of NCTU in 2004, where he is currently an Associate Professor of the Department of Electronics Engineering and the Institute of Electronics. His current research interests include thin-film-transistor (TFT) fabrication and characterization, reliability of CMOS devices, and novel SOI device technology. He has authored or coauthored over 100 technical papers in international journals and conferences in the above areas. Dr. Lin served on the program committee of the International Reliability Physics Symposium (IRPS) in 2001 and 2002. He also served on the program committee of the International Conference on Solid State Devices and Materials (SSDM) in 2005 and 2006.