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    • Research Interests
    Power Spectral Densi...Power Spectral DensityCd-SemLine-Edge RoughnessLinewidth RoughnessFlare2010202020042025
    20012024

    Papers共 141 篇Patents共 61 篇Author StatisticsCo-AuthorSimilar Experts

    By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
    时间
    引用量
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    期刊级别
    合作者
    合作机构
    All20242023202220212020201920182017201620152014201320122011201020092008200720062005
    Trends in E-Beam Metrology and Inspection
    Gian Francesco Lorusso
    METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVIII (2024)
    Cited0Views1Bibtex
    0
    1
    Wafer-scale Characterization for Two-Dimensional Material Layers
    A. Moussa,J. Bogdanowicz,B. Groven,P. Morin, M. Beggiato,M. Saib, G. Santoro, Y. Abramovitz, K. Houchens, S. Ben Nissim, N. Meir,J. Hung, A. Urbanowicz,R. Koret,I. Turovets, B. Lee, W. T. Lee,G. F. Lorusso,A. -L. Charley
    JAPANESE JOURNAL OF APPLIED PHYSICSno. 3 (2024)
    Cited0Views0Bibtex
    0
    0
    Direct Yield Prediction from SEM Images
    Lilach Choona, Jasmine Linshiz, Shaul Pres, Boris Levant, Noam Tal,Gaetano Santoro,Sylvain Baudot, Ann Opdebeeck, Jason Reifsnider,Senthil Vadakupudhu Palayam,Gian Lorusso,Jerome Mitard, Shay Yogev
    METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII (2023)
    Cited0Views4Bibtex
    0
    4
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    Author Statistics
    00.20.40.60.81#Papers#CitationH-IndexG-IndexSociabilityDiversityActivity

    #Papers: 141

    #Citation: 1319

    H-Index: 23

    G-Index: 28

    Sociability: 6

    Diversity: 2

    Activity: 2

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    • 合作者
    • 学生
    • 导师
    Danilo De Simone合作论文数
    22
    Anne-laure Charley合作论文数
    21
    Eric Hendrickx合作论文数
    20
    Rik Jonckheere合作论文数
    Imec18
    Chris A. Mack合作论文数
    Fractilia, LLC/Electrical and Computer Engineering and Chemical Engineering Departments, University of Texas at Austin17
    Anne-Marie Goethals合作论文数
    17
    Philippe Leray合作论文数
    Université Paris16
    Jan Hermans合作论文数
    15
    Kurt Ronse合作论文数
    14
    masami ikota合作论文数
    13
    Alain Moussa合作论文数
    13
    Joren Severi合作论文数
    12
    Vito Daniele Rutigliani合作论文数
    11
    Ardavan Niroomand合作论文数
    11
    Frieda Van Roey合作论文数
    11
    Amir Azordegan合作论文数
    11
    Kazuhisa Hasumi合作论文数
    10
    Germain Fenger合作论文数
    Mentor Graphics Corp10
    Sandip Halder合作论文数
    10
    takeyoshi ohashi合作论文数
    9
    Mohamed Zidan合作论文数
    9
    Vassilios Constantoudis合作论文数
    Institute of Microelectronics, NCSR Demokritos9
    Mohamed Saib合作论文数
    8
    N. Horiguchi合作论文数
    8
    Bart Baudemprez合作论文数
    8
    Kotaro Maruyama合作论文数
    7
    Seulki Kang合作论文数
    7
    Christophe Beral合作论文数
    7
    Janusz Bogdanowicz合作论文数
    Imec7
    Luca Grella合作论文数
    7
    Yuichiro Yamazaki合作论文数
    6
    osamu inoue合作论文数
    6
    Stefan De Gendt合作论文数
    6
    Alan M Myers合作论文数
    6
    Tsuyoshi Kondo合作论文数
    5
    George Papavieros合作论文数
    Nanometrisis PC, Aghia Paraskevi, Greece5
    Evangelos Gogolides合作论文数
    Institute of Nanoscience and Nanotechnology, National Centre of Scientific Research "Demokritos"5
    Ivan Pollentier合作论文数
    5
    I. Kim合作论文数
    5
    Matteo Beggiato合作论文数
    4
    A.-L. Charley合作论文数
    4
    Yasushi Ebizuka合作论文数
    4
    Chih-I Wei合作论文数
    4
    gaetano santoro合作论文数
    4
    yutaka okagawa合作论文数
    4
    Weimin Gao合作论文数
    4
    Frederic Lazzarino合作论文数
    IMEC4
    jiong jiang合作论文数
    4
    Sayantan Das合作论文数
    IMEC4
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